IGSC_IFR_RUN_TEST_STATUSES

Topics
	Gsfp

Data Structures
struct	igsc_device_mbist_ppr_status
struct	igsc_ppr_status

Enumerations
enum	igsc_ppr_test_status_mask { IGSC_PPR_STATUS_TEST_EXECUTED_MASK = 0x1 , IGSC_PPR_STATUS_TEST_SUCCESS_MASK = 0x2 , IGSC_PPR_STATUS_FOUND_HW_ERROR_MASK = 0x4 , IGSC_PPR_STATUS_HW_ERROR_REPAIRED_MASK = 0x8 }

Functions
IGSC_EXPORT int	igsc_memory_ppr_devices (IN struct igsc_device_handle *handle, OUT uint32_t *device_count)
	Retrieves GFSP number of memory PPR devices.
IGSC_EXPORT int	igsc_memory_ppr_status (IN struct igsc_device_handle *handle, OUT struct igsc_ppr_status *ppr_status)
	Retrieves GFSP memory PPR status structure data.

IGSC_IFR_RUN_TEST_STATUSES
The IFR Run Test Command Statuses
enum	ifr_test_run_status {   IFR_TEST_STATUS_SUCCESS = 0 , IFR_TEST_STATUS_PASSED_WITH_REPAIR , IFR_TEST_STATUS_PASSED_WITH_RECOVERY , IFR_TEST_STATUS_SUBSLICE_FAILURE ,   IFR_TEST_STATUS_NON_SUBSLICE_FAILURE , IFR_TEST_STATUS_ERROR }
IGSC_EXPORT int	igsc_ifr_get_status (IN struct igsc_device_handle *handle, OUT uint8_t *result, OUT uint32_t *supported_tests, OUT uint32_t *ifr_applied, OUT uint8_t *tiles_num)
	Retrieves the status of GSC IFR device.
IGSC_EXPORT int	igsc_ifr_run_test (IN struct igsc_device_handle *handle, IN uint8_t test_type, IN uint8_t tiles, OUT uint8_t *result, OUT uint8_t *run_status, OUT uint32_t *error_code)
	Runs IFR test on GSC IFR device.

Detailed Description

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Data Structure Documentation

igsc_device_mbist_ppr_status

struct igsc_device_mbist_ppr_status

Device PPR status structure

Definition at line 1739 of file igsc_lib.h.

Data Fields
uint32_t	mbist_test_status	0 – Pass, Any set bit represents that MBIST on the matching channel has failed
uint32_t	num_of_ppr_fuses_used_by_fw	Number of PPR fuses used by the firmware
uint32_t	num_of_remaining_ppr_fuses	Number of remaining PPR fuses

igsc_ppr_status

struct igsc_ppr_status

PPR status structure

Definition at line 1748 of file igsc_lib.h.

Data Fields
uint8_t	boot_time_memory_correction_pending	0 - No pending boot time memory correction, 1 - Pending boot time memory correction
struct igsc_device_mbist_ppr_status	device_mbist_ppr_status[]	Array of PPR statuses per device
uint32_t	mbist_completed	0 - Not Applied, Any set bit represents mbist completed
uint32_t	num_devices	real number of devices in the array (on Xe_HP SDV, PVC <= 8)
uint8_t	ppr_mode	0 – PPR enabled, 1 – PPR disabled, 2 – PPR test mode, 3 – PPR auto run on next boot
uint32_t	ras_ppr_applied	0 - ppr not applied, 1 - ppr applied, 2 - ppr exhausted
uint8_t	reserved
uint8_t	test_run_status	test status See also enum igsc_ppr_test_status_mask

Enumeration Type Documentation

ifr_test_run_status

enum ifr_test_run_status

Enumerator
IFR_TEST_STATUS_SUCCESS	Test passed successfully
IFR_TEST_STATUS_PASSED_WITH_REPAIR	Test passed, recoverable error found and repaired. No subslice swap needed
IFR_TEST_STATUS_PASSED_WITH_RECOVERY	Test passed, recoverable error found and repaired. Subslice swap needed.
IFR_TEST_STATUS_SUBSLICE_FAILURE	Test completed, unrecoverable error found (Subslice failure and no spare Subslice available).
IFR_TEST_STATUS_NON_SUBSLICE_FAILURE	Test completed, unrecoverable error found (non-Subslice failure).
IFR_TEST_STATUS_ERROR	Test error

Definition at line 1275 of file igsc_lib.h.

igsc_ppr_test_status_mask

enum igsc_ppr_test_status_mask

memory PPR status structures PPR test status bit masks

Definition at line 1729 of file igsc_lib.h.

Function Documentation

igsc_ifr_get_status()

IGSC_EXPORT int igsc_ifr_get_status	(	IN struct igsc_device_handle *	handle,
		OUT uint8_t *	result,
		OUT uint32_t *	supported_tests,
		OUT uint32_t *	ifr_applied,
		OUT uint8_t *	tiles_num )

Retrieves the status of GSC IFR device.

Parameters

handle	A handle to the device.
result	Test result code
supported_tests	Bitmask holding the tests supported on the platform.
ifr_applied	Bitmask holding the in field repairs was applied during boot.
tiles_num	Number of tiles on the specific SOC.

Returns

IGSC_SUCCESS if successful, otherwise error code.

igsc_ifr_run_test()

IGSC_EXPORT int igsc_ifr_run_test	(	IN struct igsc_device_handle *	handle,
		IN uint8_t	test_type,
		IN uint8_t	tiles,
		OUT uint8_t *	result,
		OUT uint8_t *	run_status,
		OUT uint32_t *	error_code )

Runs IFR test on GSC IFR device.

Parameters

handle	A handle to the device.
test_type	Requested test to run
result	Test result code
tiles	Tiles on which to run the test
run_status	Test run status
error_code	The error code of the test that was run (0 - no error)

Returns

IGSC_SUCCESS if successful, otherwise error code.

igsc_memory_ppr_devices()

IGSC_EXPORT int igsc_memory_ppr_devices	(	IN struct igsc_device_handle *	handle,
		OUT uint32_t *	device_count )

Retrieves GFSP number of memory PPR devices.

Parameters

handle	A handle to the device.
count	pointer to number of memory PPR devices, the number is returned by the FW

Returns

IGSC_SUCCESS if successful, otherwise error code.

igsc_memory_ppr_status()

IGSC_EXPORT int igsc_memory_ppr_status	(	IN struct igsc_device_handle *	handle,
		OUT struct igsc_ppr_status *	ppr_status )

Retrieves GFSP memory PPR status structure data.

Parameters

handle	A handle to the device.
ppr_status	pointer to PPR status structure, which contains num_devices field representing the number of allocated items in the device_mbist_ppr_status[] array.

Returns

IGSC_SUCCESS if successful, otherwise error code.